AM Best to Sponsor and Exhibit at Annual Society of Insurance Research Conference; Director of Industry Research to Discuss Draft Innovation Criteria

Business Wire

OLDWICK, N.J.--(BUSINESS WIRE)-- AM Best will sponsor and participate in the Annual Society of Insurance Research Conference and Exhibit Fair, taking place Oct. 20-22, 2019, in Charlotte, NC.

Sridhar Manyem, director, industry research and analytics, will lead a session, titled, “Innovation and Its Impact on Financial Strength and Regulations,” on Monday, Oct. 21, at 11:15 a.m. (EDT). In the session, Manyem will present AM Best’s plan for evaluating an insurer’s level of innovation and to what extent that evaluation ultimately will impact the measure of an insurer’s financial strength. AM Best released a draft innovation criteria procedure in March 2019, and recently refined it to increase further transparency in light of industry feedback and to reflect ongoing internal review and analysis. The draft criteria procedure is available at www.ambest.com/ratings/methodology.asp. Dr. Michelle Osborne, chief deputy insurance commissioner of North Carolina, will join Manyem during the session as part of a discussion on how insurance regulation can work in concert with emerging technologies and processes to further innovation.

The conference, which is themed as “Reimagining Research to Recognize Emerging Insurance Industry Trends,” will address the increasingly important role research plays as carriers and startups create new insurance models to address the evolving insurance marketplace. AM Best will sponsor a networking reception on Tuesday, Oct. 22, at 5:00 p.m. (EDT), and will be exhibiting throughout the event at booth No. 20.

The Society of Insurance Research facilitates research, marketing and planning services for the insurance industry. To learn more about the annual conference, please view the official agenda.

AM Best is a global credit rating agency and information provider with an exclusive focus on the insurance industry. Visit www.ambest.com for more information.